Scanning Electron Microscopy (SEM)

CLARA from TESCAN Field-Free analytical UHR SEM for materials characterization at nanoscale is designed with unique In-Beam BSE detector that allow filtering of signal based on energy and take off angle. The Axial BSE detector collects narrow-angle backscattered electrons while the Multidetector (BSE) collects mid-angle backscattered electrons.

TESCAN MAGNA is an advanced UHR SEM and STEM imaging for characterization of your biological and beam-sensitive samples with UHR imaging of non-conductive beam sensitive samples at low-kV.

MAGNA from TESCAN is unique tool for ultimate surface characterization of nanomaterials. It features the Triglav™ SEM column for excellent ultra-high-resolution imaging performance for low electron beam energies. MAGNA operates with a Schottky field electron source, capable of generating high electron beam currents up to 400 nA with Essence™ graphical user interface.

VEGA 4th generation Scanning Electron Microscope (SEM) from TESCAN has with tungsten filament electron source that combines SEM imaging and live elemental composition analysis using the TESCAN’s Essence™ software for the cquisition of both morphological and elemental data from the sample. Perfect for routine materials characterization, research and quality control applications at the micron scale.

TESCAN MIRA’s 4th generation SEM with FEG Schottky electron emission source. It significantly simplifies acquisition of both morphological and elemental data from the sample, making MIRA SEM an efficient analytical solution for routine materials inspection in quality control, failure analysis and research labs.

CLARA CRYO from TESCAN is a Versatile UHR cryo-SEM for characterization of your biological and other beam-sensitive specimens that comes in attractive price, performance and cost of ownership Proposition.