Atomic Spectrometry

The comprehensive portfolio of elemental analysis technologies offers solutions for material characterization across various phases, from solids and thin films to liquids and digests. These high-performance scientific instruments utilize diverse physical phenomena, including plasma excitation, induced combustion, and X-ray interaction, to provide both qualitative identification and quantitative measurement of elements ranging from light gases to heavy metals.

The Particle Analysis suite encompasses advanced metrology for characterizing particulate systems across the nano- to micro-scale, providing essential data points such as size distribution, molecular weight, zeta potential, and physical shape. These techniques, including light scattering, particle tracking, and controlled sedimentation, are fundamentally crucial for industries where material performance is dictated by colloidal stability, aggregation state, and precise dimensional control.

The Microscopy and Imaging portfolio delivers advanced analytical solutions for characterizing material properties at spatial scales ranging from the micrometer down to the nanometer, fundamentally addressing the limitations of bulk analysis by providing site-specific chemical, structural, and electronic information. Core technologies such as Raman Microscopy and Cathodoluminescence enable non-destructive identification of molecular composition, crystal structure, stress, and semiconductor electronic band gaps.

The Spectroscopy portfolio offers a comprehensive suite of analytical instruments designed to characterize materials across electronic, vibrational, and elemental domains, transcending the limitations of conventional bulk analysis. These technologies, ranging from high-resolution chemical imaging via Raman and AFM-Raman to electronic structure determination using Photoluminescence and Cathodoluminescence, provide the site-specific insight necessary to understand complex material function and failure points.