الصفحة الرئيسية » المنتجات » المجهر الإلكتروني الماسح » مجهر المسح الإلكتروني (SEM) » Tescan MAGNA for Material Science
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Tescan MAGNA for Material Science
TESCAN MAGNA is a sum up of Ultra-high resolution and high-contrast imaging of next-gen materials with a unique TriBE™ and TriSE™ In-Beam detection for advanced nano characterization. Rest assure that optimal imaging and analytical conditions guaranteed by TESCAN In-Flight Beam Tracing™. MAGNA is unique for TriSE™ detection, TriBE™ detection, BSE’s selective energy filtering, Precise nanometer scale studies (SEM/STEM) of material structures and UHR imaging of delicate ultra-thin brain sections with low keV backscattered electrons.
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