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MIRA for Material Science
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High-resolution analytical SEM for routine materials characterization
Tescan MIRA for Material Science
TESCAN MIRA’s 4th generation is specialized for High-resolution analytical SEM for routine materials characterization, research and quality control applications at the sub-micron scale. With FEG Schottky electron emission source MIRA combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software. Optimum imaging and analytical conditions are immediately available thanks to the unique apertureless design due to the Wide Field Optics™ design. Ultimate safety of the chamber mounted detectors when the stage and sample are in motion is guaranteed with Essence™ 3D Collision model.
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