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FIB-SEM
TESCAN SOLARIS FIB-SEM has a UHR imaging of beam-sensitive samples at low-kV. It is will utilized for routine investigation of heavy-metal stained resin-embedded samples with excellent contrast using the In-beam BSE detector at low-kV. SOLARIS has the best resolution Ga FIB column with optimized ion optics for excellent performance and reproducibility. It is used for site-specific TEM lamella preparation and in-situ visualization with an easy-to-use STEM detector that offers cost-effective imaging results comparable to TEM. SOLARIS delivers 3D nanovisualization and volume reconstruction of resin-embedded cellular structures